Electronic linear scanning micro-nano focus CT scanning system and method
专利类型：发明专利
语 言：中文
申 请 号：CN201510222456.7
申 请 日：20150504
申 请 人：重庆大学
申请人地址：400044 重庆市沙坪坝区沙坪坝正街174号
公 开 日：20170808
公 开 号：CN104757988B
代 理 人：廖曦
代理机构：北京同恒源知识产权代理有限公司 11275
摘 要：Abstract：The invention relates to an electronic linear scanning micro-nano focus CT scanning system and method and belongs to the technical field of CT scanning. The scanning system comprises a linear array micro-nano focus X-ray source, a filter, a detected object, a rotary workbench, a detector, a data acquisition system, a mechanical system, a control system, a computer and a display screen. The X-ray source comprises a linear array point-shaped X-ray target. According to the CT scanning method, through multiple times of electronic linear scanning of the linear array point-shaped X-ray target of the ray source, multiple groups of projection data are acquired, and image reestablishment is conducted and includes weighting, filtering and back projection. By the adoption of the method, when electronic linear scanning is conducted every time, the ray source, the detector and the detected object are all in the static state, and influences of mechanical motion errors, tiny vibration and other micro-nano scales on CT scanning are avoided.
主 权 项：一种电子直线扫描微纳焦点CT扫描系统，其特征在于：该扫描系统包括线阵列微纳焦点X射线源，滤波片，检测对象，旋转工作台，探测器，数据采集系统，机械系统，控制系统，计算机，显示屏；所述线阵列微纳焦点X射线源包含线阵点状X射线靶；通过控制射线源电子束偏转，实现X射线焦点在线阵点状X射线靶上的分时出束；由线阵点状X射线靶发出的X射线，经过滤波片，穿透检测对象，到达探测器，探测器将X射线衰减后的信息转换为电信号并经采集系统传入计算机，经计算机进行图像重建处理后显示；所述检测对象放置在旋转工作台上。
关 键 词：
法律状态：生效
IPC专利分类号：G01N23/04; A61B6/03